In addition to point analysis and line scans, advanced features like object analysis can be performed on this EDS system. Point analysis measures the elemental composition of the spot while line scan shows an elemental concentration profile along the line. Point analysis and line scans are some of the analysis features available on this EDS system in which specimens are analyzed at a point or along a selected line. Its live quantification in intervals of 100 milliseconds or less is convenient for recognizing changes in the spectrum across a sample. Its high input count rate allows for faster analysis. With a 30 mm 2 silicon drift detector, over 1500 kcps count rate, improved heat sink and maximum solid angle, the EDS system is optimal for both microanalysis and spectral imaging. The EDS system is highly efficient, versatile and powerful. Working in tandem, the SEM and EDS link the surface morphology with its chemical composition. The energy spectra of X-rays and their counts reveal the elemental composition of the analyzed volume. This EDS system measures characteristic X-rays emitted from the sample during the bombardment by an electron beam. Contact Stylus Surface Roughness AnalysisĮxpress Property Mapping through Accelerated NanoindentationĪlloy Composition and Phase IdentificationĮbatco’s JEOL 6610LV SEM is equipped with a Bruker XFlash 6|30 Energy Dispersive X-Ray Spectrometer (EDS) system, which expands the capabilities of the SEM to rapid qualitative and quantitative element identification and chemical analysis.
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